Literaturnachweis - Detailanzeige
| Autor/inn/en | Hackman, J. Richard; Oldham, Greg R. |
|---|---|
| Institution | Yale Univ., New Haven, CT. Dept. of Administrative Sciences. |
| Titel | The Job Diagnostic Survey: An Instrument for the Diagnosis of Jobs and the Evaluation of Job Redesign Projects. |
| Quelle | (1974), (87 Seiten)
PDF als Volltext kostenfreie Datei |
| Dokumenttyp | gedruckt; online; Monografie |
| Schlagwörter | Affective Behavior; Evaluation Methods; Job Analysis; Job Development; Job Enrichment; Job Satisfaction; Job Simplification; Measurement Instruments; Motivation Techniques; Occupational Surveys; Responses; Tables (Data); Vocational Adjustment; Work Attitudes; Work Environment |
| Abstract | The report describes the Job Diagnostic Survey (JDS), an instrument designed to measure the following classes of variables: (1) objective job characteristics, particularly the degree to which jobs are designed so that they enhance work motivation and job satisfaction; (2) personnel affective reactions of individuals to their jobs and work setting; (3) the readiness of individuals to respond positively to "enriched" jobs--jobs with high potential for generating internal work motivation. Based on a specific theory of how jobs affect employee motivation, the JDS is intended to: (1) diagnose existing jobs to determine if (and how) redesigning could improve employee productivity and satisfaction; and (2) evaluate the effect of job changes on employees--whether the changes derive from deliberate "job enrichment" projects or from naturally occurring modifications of technology or work systems. The JDS has gone through three cycles of revision and pre-testing. Reliability and validity data are summarized for 658 employees in 62 different jobs in seven organizations who have responded to the revised instrument. Two supplementary instruments are also described: (1) a rating form for assessing "target" jobs; and (2) a short form of the JDS. All instruments and scoring keys are appended. (Author/MW) |
| Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
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