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Autor/inn/enBoyd, Aimee M.; Dodd, Barbara; Fitzpatrick, Steven
TitelA Comparison of Exposure Control Procedures in CAT Systems Based on Different Measurement Models for Testlets
QuelleIn: Applied Measurement in Education, 26 (2013) 2, S.113-135 (23 Seiten)Infoseite zur Zeitschrift
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Spracheenglisch
Dokumenttypgedruckt; online; Zeitschriftenaufsatz
ISSN0895-7347
DOI10.1080/08957347.2013.765434
SchlagwörterComputer Assisted Testing; Item Response Theory; Test Construction; Models; Multiple Choice Tests; Psychometrics
AbstractThis study compared several exposure control procedures for CAT systems based on the three-parameter logistic testlet response theory model (Wang, Bradlow, & Wainer, 2002) and Masters' (1982) partial credit model when applied to a pool consisting entirely of testlets. The exposure control procedures studied were the modified within 0.10 logits procedure (Davis & Dodd, 2003), the Sympson-Hetter procedure (Sympson & Hetter, 1985) with a maximum exposure rate restricted to 0.19, the Sympson-Hetter procedure (Sympson & Hetter, 1985) with a maximum exposure rate restricted to 0.29, and maximum information, a no exposure control condition, used as a baseline. The exposure control procedures were evaluated for measurement precision, utilization of the testlet pool, and testlet overlap across test administrations. For both measurement models, the modified within 0.10 logits procedure provided better pool utilization with little decrement in precision of measurement than either of the Sympson-Hetter procedures. (Contains 4 figures and 8 tables.) (As Provided).
AnmerkungenRoutledge. Available from: Taylor & Francis, Ltd. 325 Chestnut Street Suite 800, Philadelphia, PA 19106. Tel: 800-354-1420; Fax: 215-625-2940; Web site: http://www.tandf.co.uk/journals
Erfasst vonERIC (Education Resources Information Center), Washington, DC
Update2017/4/10
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