Literaturnachweis - Detailanzeige
| Autor/in | van der Linden, Wim J. |
|---|---|
| Titel | Test Design and Speededness |
| Quelle | In: Journal of Educational Measurement, 48 (2011) 1, S.44-60 (17 Seiten)Infoseite zur Zeitschrift
PDF als Volltext |
| Sprache | englisch |
| Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
| ISSN | 0022-0655 |
| DOI | 10.1111/j.1745-3984.2010.00130.x |
| Schlagwörter | Test Format; Reaction Time; Test Construction |
| Abstract | A critical component of test speededness is the distribution of the test taker's total time on the test. A simple set of constraints on the item parameters in the lognormal model for response times is derived that can be used to control the distribution when assembling a new test form. As the constraints are linear in the item parameters, they can easily be included in a mixed integer programming model for test assembly. The use of the constraints is demonstrated for the problems of assembling a new test form to be equally speeded as a reference form, test assembly in which the impact of a change in the content specifications on speededness is to be neutralized, and the assembly of test forms with a revised level of speededness. (As Provided). |
| Anmerkungen | Wiley-Blackwell. 350 Main Street, Malden, MA 02148. Tel: 800-835-6770; Tel: 781-388-8598; Fax: 781-388-8232; e-mail: cs-journals@wiley.com; Web site: http://www.wiley.com/WileyCDA/ |
| Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
| Update | 2017/4/10 |
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