Automated Test Assembly for Cognitive Diagnosis Models Using a Genetic Algorithm

Autor/inn/en	Finkelman, Matthew; Kim, Wonsuk; Roussos, Louis A.
Titel	Automated Test Assembly for Cognitive Diagnosis Models Using a Genetic Algorithm
Quelle	In: Journal of Educational Measurement, 46 (2009) 3, S.273-292 (20 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0022-0655
DOI	10.1111/j.1745-3984.2009.00081.x
Schlagwörter	Identification; Genetics; Test Construction; Mathematics; Automation; Measures (Individuals); Measurement Techniques; Cognitive Measurement; Psychometrics; Simulation; Computer Assisted Testing; Computer Software + Suchen Sie Ihr Suchwort? Identifikation; Identifizierung; Humangenetik; Testaufbau; Mathematik; Messdaten; Messtechnik; Psychometry; Psychometrie; Simulation program; Simulationsprogramm
Abstract	Much recent psychometric literature has focused on cognitive diagnosis models (CDMs), a promising class of instruments used to measure the strengths and weaknesses of examinees. This article introduces a genetic algorithm to perform automated test assembly alongside CDMs. The algorithm is flexible in that it can be applied whether the goal is to minimize the average number of classification errors, minimize the maximum error rate across all attributes being measured, hit a target set of error rates, or optimize any other prescribed objective function. Under multiple simulation conditions, the algorithm compared favorably with a standard method of automated test assembly, successfully finding solutions that were appropriate for each stated goal. (As Provided).
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Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2017/4/10