Reliable Digit Span is Unaffected by Laboratory-Induced Pain

Autor/inn/en	Etherton, Joseph L.; Bianchini, Kevin J.; Ciota, Megan A.; Greve, Kevin W.
Titel	Reliable Digit Span is Unaffected by Laboratory-Induced Pain
Quelle	In: Assessment, 12 (2005) 1, S.101-106 (6 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	1073-1911
DOI	10.1177/1073191104270789
Schlagwörter	Response Style (Tests); Simulation; Intelligence Tests; Pain; Scores; Cognitive Ability; Evaluation Research; Research Methodology; Undergraduate Students; Test Validity; Test Bias + Suchen Sie Ihr Suchwort? Antwortverhalten; Simulation program; Simulationsprogramm; Intelligence test; Intelligenztest; Schmerz; Denkfähigkeit; Evaluationsforschung; Research method; Forschungsmethode; Testvalidität; Testkritik
Abstract	Reliable Digit Span (RDS) is an indicator used to assess the validity of cognitive test performance. Scores of 7 or lower suggest poor effort or negative response bias. The possibility that RDS scores are also affected by pain has not been addressed thus potentially threatening RDS specificity. The current study used cold pressor-induced pain to investigate the effect of pain on RDS scores. Sixty undergraduate volunteers randomly assigned to one of three conditions (control, simulator, pain) completed the Digit Span subtest from the Wechsler Adult Intelligence Scale-III from which the RDS is derived. No differences in RDS scores were found between the control and pain groups, and neither group scored below 8. Sixty-five percent of the simulator group scored 7 or below. These results suggest that RDS is not affected by pain, and scores of 7 or less in persons with pain can be more confidently attributed to negative response bias. (Author).
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Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2017/4/10