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Autor/inn/en | Chalmers, R. Philip; Zheng, Guoguo |
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Titel | Multi-Group Generalizations of SIBTEST and Crossing-SIBTEST |
Quelle | In: Applied Measurement in Education, 36 (2023) 2, S.171-191 (21 Seiten)Infoseite zur Zeitschrift
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Zusatzinformation | ORCID (Chalmers, R. Philip) |
Sprache | englisch |
Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
ISSN | 0895-7347 |
DOI | 10.1080/08957347.2023.2201703 |
Schlagwörter | Test Bias; Test Items; Item Response Theory; Error of Measurement; Monte Carlo Methods; Regression (Statistics); Generalization |
Abstract | This article presents generalizations of SIBTEST and crossing-SIBTEST statistics for differential item functioning (DIF) investigations involving more than two groups. After reviewing the original two-group setup for these statistics, a set of multigroup generalizations that support contrast matrices for joint tests of DIF are presented. To investigate the Type I error and power behavior of these generalizations, a Monte Carlo simulation study was then explored. Results indicated that the proposed generalizations are reasonably effective at recovering their respective population parameter definitions, maintain optimal Type I error control, have suitable power to detect uniform and non-uniform DIF, and in shorter tests are competitive with the generalized logistic regression and generalized Mantel-Haenszel tests for DIF. (As Provided). |
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Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
Update | 2024/1/01 |