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Autor/inn/enTijmstra, Jesper; Bolsinova, Maria; Liaw, Yuan-Ling; Rutkowski, Leslie; Rutkowski, David
TitelSensitivity of the RMSD for Detecting Item-Level Misfit in Low-Performing Countries
QuelleIn: Journal of Educational Measurement, 57 (2020) 4, S.566-583 (18 Seiten)Infoseite zur Zeitschrift
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ZusatzinformationORCID (Tijmstra, Jesper)
ORCID (Bolsinova, Maria)
Spracheenglisch
Dokumenttypgedruckt; online; Zeitschriftenaufsatz
ISSN0022-0655
DOI10.1111/jedm.12263
SchlagwörterTest Items; Goodness of Fit; Probability; Accuracy; International Assessment; Item Response Theory; Error of Measurement; Item Analysis; Simulation; Achievement Tests; Foreign Countries; Secondary School Students; Program for International Student Assessment
AbstractAlthough the root-mean squared deviation (RMSD) is a popular statistical measure for evaluating country-specific item-level misfit (i.e., differential item functioning [DIF]) in international large-scale assessment, this paper shows that its sensitivity to detect misfit may depend strongly on the proficiency distribution of the considered countries. Specifically, items for which most respondents in a country have a very low (or high) probability of providing a correct answer will rarely be flagged by the RMSD as showing misfit, even if very strong DIF is present. With many international large-scale assessment initiatives moving toward covering a more heterogeneous group of countries, this raises issues for the ability of the RMSD to detect item-level misfit, especially in low-performing countries that are not well-aligned with the overall difficulty level of the test. This may put one at risk of incorrectly assuming measurement invariance to hold, and may also inflate estimated between-country difference in proficiency. The degree to which the RMSD is able to detect DIF in low-performing countries is studied using both an empirical example from PISA 2015 and a simulation study. (As Provided).
AnmerkungenWiley. Available from: John Wiley & Sons, Inc. 111 River Street, Hoboken, NJ 07030. Tel: 800-835-6770; e-mail: cs-journals@wiley.com; Web site: https://www.wiley.com/en-us
Erfasst vonERIC (Education Resources Information Center), Washington, DC
Update2024/1/01
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