Exploring Behavioural Patterns during Complex Problem-Solving

Autor/inn/en	Eichmann, Beate; Greiff, Samuel; Naumann, Johannes; Brandhuber, Liene; Goldhammer, Frank
Titel	Exploring Behavioural Patterns during Complex Problem-Solving
Quelle	In: Journal of Computer Assisted Learning, 36 (2020) 6, S.933-956 (24 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Zusatzinformation	ORCID (Eichmann, Beate)
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0266-4909
DOI	10.1111/jcal.12451
Schlagwörter	Behavior Patterns; Difficulty Level; Problem Solving; Success; Failure; Foreign Countries; Achievement Tests; Secondary School Students; International Assessment; Learning Analytics; Program for International Student Assessment + Suchen Sie Ihr Suchwort? Schwierigkeitsgrad; Problemlösen; Erfolg; Ausland; Achievement test; Achievement; Testing; Test; Tests; Leistungsbeurteilung; Leistungsüberprüfung; Leistung; Testdurchführung; Testen; Sekundarschüler
Abstract	In this explorative study, we investigate how sequences of behaviour are related to success or failure in complex problem-solving (CPS). To this end, we analysed log data from two different tasks of the problem-solving assessment of the Programme for International Student Assessment 2012 study (n = 30,098 students). We first coded every interaction of students as (initial or repeated) exploration, (initial or repeated) goal-directed behaviour, or resetting the task. We then split the data according to task successes and failures. We used full-path sequence analysis to identify groups of students with similar behavioural patterns in the respective tasks. Double-checking and minimalistic behaviour was associated with success in CPS, while guessing and exploring task-irrelevant content was associated with failure. Our findings held for both tasks investigated, from two different CPS measurement frameworks. We thus gained detailed insight into the behavioural processes that are related to success and failure in CPS. (As Provided).
Anmerkungen	Wiley. Available from: John Wiley & Sons, Inc. 111 River Street, Hoboken, NJ 07030. Tel: 800-835-6770; e-mail: cs-journals@wiley.com; Web site: https://www.wiley.com/en-us
Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2024/1/01