On the Superior Statistical Properties of Frequency Scales in Job Analyses

Autor/inn/en	Babcock, Ben; Risk, Nicole M.; Wyse, Adam E.
Titel	On the Superior Statistical Properties of Frequency Scales in Job Analyses
Quelle	In: Educational Measurement: Issues and Practice, 39 (2020) 2, S.85-95 (11 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Zusatzinformation	ORCID (Babcock, Ben) ORCID (Wyse, Adam E.)
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0731-1745
DOI	10.1111/emip.12327
Schlagwörter	Job Analysis; Radiology; Allied Health Personnel; Surveys; Interrater Reliability; Task Analysis; Rating Scales + Suchen Sie Ihr Suchwort? Arbeitsanalyse; Radiologie; Survey; Umfrage; Befragung; Interrater-Reliabilität; Aufgabenanalyse; Rating-Skala
Abstract	This study compared the statistical properties of four job analysis task survey response scale types: criticality, difficulty in learning, importance, and frequency. We used nine job analysis studies spanning two fields, medical imaging and allied health professionals, to compare the job analysis scales in terms of variability and interrater agreement. Results showed that frequency scales using absolute anchors had greater between-task variability and higher interrater agreement for all nine studies. This may have occurred due to what has been described by past research as self-presentation bias. In this case, an aggregate base percentage of respondents always responded that tasks in their domain are highly critical, highly important, and easy to learn. These results showed that frequency scales with absolute anchors yielded data with better statistical performance than other more subjective scales. These properties do not answer the question of whether a scale matches an exam's purpose, which is the most important consideration for job analyses. They do, however, suggest that, if statistics are a primary deciding factor, strong consideration should be given to using frequency scales with absolute anchors. (As Provided).
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Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2024/1/01