Literaturnachweis - Detailanzeige
Autor/in | Renshaw, Tyler L. |
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Titel | Screening Using the SDQ Total Difficulties Scale: An Analog Test of Three Cutoff Values |
Quelle | In: Journal of Psychoeducational Assessment, 37 (2019) 8, S.1030-1036 (7 Seiten)Infoseite zur Zeitschrift
PDF als Volltext |
Zusatzinformation | ORCID (Renshaw, Tyler L.) |
Sprache | englisch |
Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
ISSN | 0734-2829 |
DOI | 10.1177/0734282918809808 |
Schlagwörter | Behavior Problems; Child Behavior; Screening Tests; Questionnaires; Test Validity; Classification; Middle School Students; Grade 6; Grade 7; Cutting Scores; Well Being; Strengths and Difficulties Questionnaire Screening-Verfahren; Fragebogen; Testvalidität; Classification system; Klassifikation; Klassifikationssystem; Middle school; Middle schools; Student; Students; Mittelschule; Mittelstufenschule; Schüler; Schülerin; School year 06; 6. Schuljahr; Schuljahr 06; School year 07; 7. Schuljahr; Schuljahr 07; Well-being; Wellness; Wohlbefinden |
Abstract | This brief report presents an analog test of the relative classification validity of three cutoff values (CVs; 16, 18, and 20) derived from responses to the self-report version of the Strengths and Difficulties Questionnaire: Total Difficulties Scale. Results from Bayesian t-tests, using several school-specific subjective well-being indicators as dependent variables, yielded evidence suggesting all CV models effectively differentiated between students with lower and higher levels of risk. Evidence also indicated that the lowest CV (16) was more effective than the higher CVs (18, 20) at identifying students with greater levels of risk, and that the higher CVs functioned comparably well. Implications for future research and practice are noted. (As Provided). |
Anmerkungen | SAGE Publications. 2455 Teller Road, Thousand Oaks, CA 91320. Tel: 800-818-7243; Tel: 805-499-9774; Fax: 800-583-2665; e-mail: journals@sagepub.com; Web site: http://sagepub.com |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
Update | 2020/1/01 |