Literaturnachweis - Detailanzeige
| Autor/inn/en | Jean, Ming-Der; Jiang, Ji-Bin; Chien, Jia-Yi |
|---|---|
| Titel | Identification and Assessment of Professional Competencies for Implementation of Nanotechnology in Engineering Education |
| Quelle | In: European Journal of Engineering Education, 42 (2017) 6, S.701-711 (11 Seiten)Infoseite zur Zeitschrift
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| Sprache | englisch |
| Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
| ISSN | 0304-3797 |
| DOI | 10.1080/03043797.2016.1216522 |
| Schlagwörter | Competence; Engineering Education; Delphi Technique; Foreign Countries; Content Analysis; Questionnaires; Interviews; Expertise; Technology; Career Development; Molecular Structure; Heat; Undergraduate Students; Interdisciplinary Approach; Taiwan |
| Abstract | The purpose of this study was to construct the indicators of professional competencies of the nanotechnology-based sputtering system industry based on industry requirements and analyse the core competencies of the industry for promoting the human resource of physical vapour deposition technology. The document analysis, expert interview, and Delphi technique surveys were considered and the survey items with 32 items divided into 7 domains were selected according to consensus opinions of 10 experts by the Delphi survey technique. Through three questionnaire surveys' analysis, the professional competence scales for the K-S tests showed a good internal consistency. The findings of this study provide guidelines for professional competence for nanotechnology-based sputtering technology by applying surface heat-treatment industry. These guidelines can also reveal the practical competency requirements of nanotechnology-based sputtering technology to deal with any subsequent challenges, future developments, and invisible services for students in a technology institute programme. (As Provided). |
| Anmerkungen | Taylor & Francis. Available from: Taylor & Francis, Ltd. 530 Walnut Street Suite 850, Philadelphia, PA 19106. Tel: 800-354-1420; Tel: 215-625-8900; Fax: 215-207-0050; Web site: http://www.tandf.co.uk/journals |
| Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
| Update | 2020/1/01 |
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