Literaturnachweis - Detailanzeige
Autor/inn/en | Ottone-Cross, Karen L.; Dulong-Langley, Susan; Root, Melissa M.; Gelbar, Nicholas; Bray, Melissa A.; Luria, Sarah R.; Choi, Dowon; Kaufman, James C.; Courville, Troy; Pan, Xingyu |
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Titel | Beyond the Mask: Analysis of Error Patterns on the KTEA-3 for Students with Giftedness and Learning Disabilities |
Quelle | In: Journal of Psychoeducational Assessment, 35 (2017) 1-2, S.74-93 (20 Seiten)Infoseite zur Zeitschrift
PDF als Volltext |
Sprache | englisch |
Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
ISSN | 0734-2829 |
DOI | 10.1177/0734282916669910 |
Schlagwörter | Achievement Tests; Error Patterns; Gifted Disabled; Learning Disabilities; Cognitive Ability; Thinking Skills; Comparative Analysis; Academically Gifted; Multivariate Analysis; Scores; Kaufman Test of Educational Achievement |
Abstract | An understanding of the strengths, weaknesses, and achievement profiles of students with giftedness and learning disabilities (G&LD) is needed to address their asynchronous development. This study examines the subtests and error factors in the Kaufman Test of Educational Achievement--Third Edition (KTEA-3) for strength and weakness patterns of students with G&LD in higher and lower level thinking skills by comparing G&LD students (n = 196) with academically gifted (GT; n = 69) and specific learning disability (SLD) students (n = 90). Several one-way MANCOVAs were conducted with subtest error factor scores as dependent variables and grouping variable (G&LD, GT, or SLD) as the independent variable. The G&LD means scores across subtests were in between the two control groups. On many higher level thinking tasks, the G&LD group scored similar to the gifted group. The results support the use of error analysis to gain further understanding into the profile of students with G&LD. (As Provided). |
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Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
Update | 2020/1/01 |