Literaturnachweis - Detailanzeige
Autor/inn/en | Debeer, Dries; Janssen, Rianne |
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Titel | Modeling Item-Position Effects within an IRT Framework |
Quelle | In: Journal of Educational Measurement, 50 (2013) 2, S.164-185 (22 Seiten)Infoseite zur Zeitschrift
PDF als Volltext |
Sprache | englisch |
Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
ISSN | 0022-0655 |
DOI | 10.1111/jedm.12009 |
Schlagwörter | Item Response Theory; Test Items; Test Format; Models; Scores; Test Bias; Difficulty Level; Individual Differences; Grade 8; Secondary School Students; Listening Comprehension Tests; French; Achievement Tests; Foreign Countries; Goodness of Fit; Belgium; Turkey; Program for International Student Assessment Item-Response-Theorie; Test content; Testaufgabe; Testentwicklung; Analogiemodell; Testkritik; Schwierigkeitsgrad; Individueller Unterschied; School year 08; 8. Schuljahr; Schuljahr 08; Sekundarschüler; Hörverstehensübung; Französisch; Achievement test; Achievement; Testing; Test; Tests; Leistungsbeurteilung; Leistungsüberprüfung; Leistung; Testdurchführung; Testen; Ausland; Belgien; Türkei |
Abstract | Changing the order of items between alternate test forms to prevent copying and to enhance test security is a common practice in achievement testing. However, these changes in item order may affect item and test characteristics. Several procedures have been proposed for studying these item-order effects. The present study explores the use of descriptive and explanatory models from item response theory for detecting and modeling these effects in a one-step procedure. The framework also allows for consideration of the impact of individual differences in position effect on item difficulty. A simulation was conducted to investigate the impact of a position effect on parameter recovery in a Rasch model. As an illustration, the framework was applied to a listening comprehension test for French as a foreign language and to data from the PISA 2006 assessment. (Contains 6 tables and 3 figures.) (As Provided). |
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Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
Update | 2017/4/10 |