Explanatory Secondary Dimension Modeling of Latent Differential Item Functioning

Autor/inn/en	De Boeck, Paul; Cho, Sun-Joo; Wilson, Mark
Titel	Explanatory Secondary Dimension Modeling of Latent Differential Item Functioning
Quelle	In: Applied Psychological Measurement, 35 (2011) 8, S.583-603 (21 Seiten) PDF als Volltext Verfügbarkeit
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0146-6216
DOI	10.1177/0146621611428446
Schlagwörter	Test Bias; Models; Statistical Analysis; Computation; Computer Software + Suchen Sie Ihr Suchwort? Testkritik; Analogiemodell; Statistische Analyse
Abstract	The models used in this article are secondary dimension mixture models with the potential to explain differential item functioning (DIF) between latent classes, called latent DIF. The focus is on models with a secondary dimension that is at the same time specific to the DIF latent class and linked to an item property. A description of the models is provided along with a means of estimating model parameters using easily available software and a description of how the models behave in two applications. One application concerns a test that is sensitive to speededness and the other is based on an arithmetic operations test where the division items show latent DIF. (Contains 4 tables and 1 figure.) (As Provided).
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Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2017/4/10