Literaturnachweis - Detailanzeige
Autor/inn/en | Vandivier, Phillip L.; Vandivier, Stella Sue |
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Titel | A "Nonbiased Assessment" of Intelligence Testing. |
Quelle | In: Educational Forum, 44 (1979) 1, S.97-108Infoseite zur Zeitschrift |
Sprache | englisch |
Dokumenttyp | gedruckt; Zeitschriftenaufsatz |
Schlagwörter | Academic Achievement; Diagnostic Tests; Elementary Secondary Education; Intelligence; Intelligence Tests; Mental Retardation; Minority Groups; Test Bias; Test Interpretation; Test Norms; Test Reliability; Test Validity; Values; Stanford Binet Intelligence Scale; Wechsler Intelligence Scale for Children |
Abstract | Arguments and prejudices against the use of individually administered intelligence tests are considered and compared with possible values that may be obtained. Cautions about test score interpretation are discussed. Implications of abolishing intelligence testing are considered and recommendations for effective testing policies are presented. (CTM) |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |