Literaturnachweis - Detailanzeige
Autor/inn/en | Vandivier, Phillip L.; Vandivier, Stella Sue |
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Titel | A "Nonbiased Assessment" of Intelligence Testing. |
Quelle | In: Educational Forum, 44 (1979) 1, S.97-108Infoseite zur Zeitschrift |
Sprache | englisch |
Dokumenttyp | gedruckt; Zeitschriftenaufsatz |
Schlagwörter | Stellungnahme; Academic Achievement; Academic Aptitude; Background; Disadvantaged Youth; Educationally Disadvantaged; Intelligence; Intelligence Differences; Intelligence Tests; Predictive Validity; Special Education; Test Bias; Test Reliability; Test Results; Stanford Binet Intelligence Scale; Wechsler Intelligence Scale for Children |
Abstract | Discusses the most widely used individual intelligence tests: Wechsler Intelligence Scale for Children (WISC) and Stanford-Binet Intelligence Scale (Form L-M). Covers what the tests measure; psychometric or technical properties of the tests; and how test results are used. (JOW) |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |