Fading Affect Bias in Mexico: Differential Fading of Emotional Intensity in Death Memories and Everyday Negative Memories

Autor/inn/en	Bond, Gary D.; Speller, Lassiter F.; Jiménez, Jaqueline Coeto; Smith, Danielle; Marin, Perla G.; Greenham, Melanie B.; Holman, Rebecka D.; Varela, Edward
Titel	Fading Affect Bias in Mexico: Differential Fading of Emotional Intensity in Death Memories and Everyday Negative Memories
Quelle	In: Applied Cognitive Psychology, 36 (2022) 5, S.1022-1033 (12 Seiten) PDF als Volltext Verfügbarkeit
Zusatzinformation	ORCID (Bond, Gary D.)
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0888-4080
DOI	10.1002/acp.3987
Schlagwörter	Bias; Foreign Countries; Psychological Patterns; Death; Memory; Depression (Psychology); Posttraumatic Stress Disorder; Mexico + Suchen Sie Ihr Suchwort? Ausland; Sterbefall; Tod; Todesfall; Gedächtnis; Mexiko
Abstract	Fading affect bias (FAB) is a phenomenon wherein the intensity of negative emotions associated with an autobiographical memory decrease more rapidly than the intensity of positive emotions. The present study had three aims: (1) to determine whether FAB could be replicated in extreme event memories (the loss of loved ones) in the Mexican culture; (2) to determine whether greater fading would occur in psychologically closed compared to unresolved memories; and (3) whether depression and posttraumatic stress disorder (PTSD) moderate FAB. Mexican community members' positive, negative, and memories for the loss of loved ones were recorded. Emotional intensity was rated at the time the event occurred and currently. Memories for the death of loved ones showed fading, but not as much fading as that shown in everyday negative memories. Fading was not related to memory resolution. Participants with greater PTSD symptoms showed lower fading affect across all memories. (As Provided).
Anmerkungen	Wiley. Available from: John Wiley & Sons, Inc. 111 River Street, Hoboken, NJ 07030. Tel: 800-835-6770; e-mail: cs-journals@wiley.com; Web site: https://www.wiley.com/en-us
Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2024/1/01