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Autor/inn/enFilippello, Pina; Buzzai, Caterina; Sorrenti, Luana; Costa, Sebastiano; Abramo, Annarita; Wang, Kennet T.
TitelItalian Version of the Family Almost Perfect Scale: Psychometric Characteristics and Relationships with Academic Engagement, Self-Esteem, and Personal Perfectionism
QuelleIn: Applied Developmental Science, 25 (2021) 4, S.351-363 (13 Seiten)
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ZusatzinformationORCID (Filippello, Pina)
ORCID (Sorrenti, Luana)
ORCID (Costa, Sebastiano)
Spracheenglisch
Dokumenttypgedruckt; online; Zeitschriftenaufsatz
ISSN1088-8691
DOI10.1080/10888691.2019.1647106
SchlagwörterItalian; Personality Measures; Undergraduate Students; Parent Attitudes; Factor Structure; Construct Validity; Reliability; Self Esteem; Learner Engagement; Profiles; Comparative Analysis; Psychological Patterns; Family Relationship; Counseling; Academic Achievement; Parent Aspiration; Foreign Countries; Student Attitudes; Correlation; Personality Traits; Italy
AbstractThe aim of this manuscript is to examine the perceived parental perfectionism in undergraduate Italian students. Study 1 aimed at exploring the factorial structure, reliability, and construct validity of the Italian version of the Family Almost Perfect Scale (FAPS). The aim of Study 2 was to cross-validate the FAPS structure with a different sample and to examine the relationship of family perfectionism with personal perfectionism, self-esteem, and academic engagement. In Study 2, we compared different profiles of perceived perfectionistic families on these stated psychological indicators. Results provided evidence for the applicability of the FAPS in an Italian sample. Participants of Study 2 were classified by latent profile analyses into four different profiles of perceived perfectionistic families and compared on psychological indicators. The results confirm that family discrepancy is the most detrimental aspect of perceived parental perfectionism, which warrants attention through psychological counseling. (As Provided).
AnmerkungenRoutledge. Available from: Taylor & Francis, Ltd. 530 Walnut Street Suite 850, Philadelphia, PA 19106. Tel: 800-354-1420; Tel: 215-625-8900; Fax: 215-207-0050; Web site: http://www.tandf.co.uk/journals
Erfasst vonERIC (Education Resources Information Center), Washington, DC
Update2024/1/01
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