Assessment of Fit of Item Response Theory Models Used in Large-Scale Educational Survey Assessments

Autor/inn/en	van Rijn, Peter W.; Sinharay, Sandip; Haberman, Shelby J.; Johnson, Matthew S.
Titel	Assessment of Fit of Item Response Theory Models Used in Large-Scale Educational Survey Assessments
Quelle	In: Large-scale Assessments in Education, 4 (2016), Artikel 10 (23 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Zusatzinformation	ORCID (Sinharay, Sandip) Weitere Informationen
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	2196-0739
DOI	10.1186/s40536-016-0025-3
Schlagwörter	Goodness of Fit; Item Response Theory; Regression (Statistics); National Competency Tests; Achievement Tests; Elementary Secondary Education; Foreign Countries; International Assessment; Mathematics Achievement; Mathematics Tests; Science Achievement; Science Tests; Error Patterns; Item Analysis; National Assessment of Educational Progress; Trends in International Mathematics and Science Study + Suchen Sie Ihr Suchwort? Item-Response-Theorie; Regression; Regressionsanalyse; Achievement test; Achievement; Testing; Test; Tests; Leistungsbeurteilung; Leistungsüberprüfung; Leistung; Testdurchführung; Testen; Ausland; Mathmatics sikills; Mathmatics achievement; Mathematical ability; Mathematische Kompetenz; Fehlertyp; Itemanalyse
Abstract	Latent regression models are used for score-reporting purposes in large-scale educational survey assessments such as the National Assessment of Educational Progress (NAEP) and Trends in International Mathematics and Science Study (TIMSS). One component of these models is based on item response theory. While there exists some research on assessment of fit of item response theory models in the context of large-scale assessments, there is a scope of further research on the topic. We suggest two types of residuals to assess the fit of item response theory models in the context of large-scale assessments. The Type I error rates and power of the residuals are computed from simulated data. The residuals are computed using data from four NAEP assessments. Misfit was found for all data sets for both types of residuals, but the practical significance of the misfit was minimal. (As Provided).
Anmerkungen	Springer. Available from: Springer Nature. 233 Spring Street, New York, NY 10013. Tel: 800-777-4643; Tel: 212-460-1500; Fax: 212-348-4505; e-mail: customerservice@springernature.com; Web site: https://link.springer.com/
Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2020/1/01