A Semiparametric Model for Jointly Analyzing Response Times and Accuracy in Computerized Testing

Autor/inn/en	Wang, Chun; Fan, Zhewen; Chang, Hua-Hua; Douglas, Jeffrey A.
Titel	A Semiparametric Model for Jointly Analyzing Response Times and Accuracy in Computerized Testing
Quelle	In: Journal of Educational and Behavioral Statistics, 38 (2013) 4, S.381-417 (37 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	1076-9986
DOI	10.3102/1076998612461831
Schlagwörter	Reaction Time; Computer Assisted Testing; Test Items; Accuracy; Models; Statistical Analysis; Computation; Monte Carlo Methods; Markov Processes; Goodness of Fit; Bayesian Statistics + Suchen Sie Ihr Suchwort? Reaktionsvermögen; Test content; Testaufgabe; Analogiemodell; Statistische Analyse; Monte-Carlo-Methode; Markowscher Prozess
Abstract	The item response times (RTs) collected from computerized testing represent an underutilized type of information about items and examinees. In addition to knowing the examinees' responses to each item, we can investigate the amount of time examinees spend on each item. Current models for RTs mainly focus on parametric models, which have the advantage of conciseness, but may suffer from reduced flexibility to fit real data. We propose a semiparametric approach, specifically, the Cox proportional hazards model with a latent speed covariate to model the RTs, embedded within the hierarchical framework proposed by van der Linden to model the RTs and response accuracy simultaneously. This semiparametric approach combines the flexibility of nonparametric modeling and the brevity and interpretability of the parametric modeling. A Markov chain Monte Carlo method for parameter estimation is given and may be used with sparse data obtained by computerized adaptive testing. Both simulation studies and real data analysis are carried out to demonstrate the applicability of the new model. (Contains 8 figures and 3 tables.) (As Provided).
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Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2017/4/10