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Autor/inn/en | Pine, Steven M.; Weiss, David J. |
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Institution | Minnesota Univ., Minneapolis. Dept. of Psychology. |
Titel | A Comparison of the Fairness of Adaptive and Conventional Testing Strategies. Research Report 78-1. |
Quelle | (1978), (42 Seiten)
PDF als Volltext |
Sprache | englisch |
Dokumenttyp | gedruckt; online; Monographie |
Schlagwörter | Adaptive Testing; Bayesian Statistics; Comparative Testing; Computer Assisted Testing; Item Analysis; Minority Groups; Occupational Tests; Personnel Selection; Prediction; Simulation; Test Bias; Test Construction; Test Items; Test Validity |
Abstract | This report examines how selection fairness is influenced by the characteristics of a selection instrument in terms of its distribution of item difficulties, level of item discrimination, degree of item bias, and testing strategy. Computer simulation was used in the administration of either a conventional or Bayesian adaptive ability test to a hypothetical target population consisting of a minority and majority subgroup. Fairness was evaluated by three indices which reflect the degree of differential validity, errors in prediction (Cleary's model), and proportion of applicants exceeding a selection cutoff (Thorndike's model). Major findings are: (1) when used in conjunction with either the Bayesian or conventional test, differential prediction increased fairness and facilitated the interpretation of the fairness indices; (2) the Bayesian adaptive tests were consistently fairer than the conventional tests for all item pools above the alpha=.7 discrimination level for tests of more than 30 items; (3) the differential prediction version of the Bayesian adaptive test produced almost perfectly fair performance on all fairness indices at high discrimination levels; and (4) the placement of subgroup prior distribution in the Bayesian adaptive testing procedure can affect test fairness. (Author/CTM) |
Anmerkungen | Psychometric Methods Program, Department of Psychology, University of Minnesota, 75 East River Road, Minneapolis, Minnesota 55455 (no charge, while supplies last); National Technical Information Service, Springfield, Virginia 22161 |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
Update | 2004/1/01 |