Literaturnachweis - Detailanzeige
Autor/inn/en | Gu, Yongqi; und weitere |
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Titel | How Often Is Often? Reference Ambiguities of the Likert-Scale in Language Learning Strategy Research. |
Quelle | (1995), (18 Seiten)
PDF als Volltext |
Sprache | englisch |
Dokumenttyp | gedruckt; online; Monographie |
Schlagwörter | Ambiguity; College Students; English (Second Language); Foreign Countries; Higher Education; Language Research; Learning Strategies; Likert Scales; Questionnaires; Rating Scales; Second Language Learning; Statistical Analysis; Test Format; China Collegestudent; English as second language; English; Second Language; Englisch als Zweitsprache; Ausland; Hochschulbildung; Hochschulsystem; Hochschulwesen; Sprachforschung; Learning methode; Learning techniques; Lernmethode; Lernstrategie; Likert-Skala; Fragebogen; Rating-Skala; Zweitsprachenerwerb; Statistische Analyse; Testentwicklung |
Abstract | Based on personal experience, this paper examines the ambiguities of the Likert-type 5-point scale in learning strategy elicitation. Four parallel questionnaires consisting of the same batch of 20 items taken from the Oxford scale (1990) were administered among a group of 120 tertiary level, non-English majors in China. Questionnaire 1 used the Oxford scale without specifying dimensions of reference. Questionnaire 2 told the respondents to choose their answers by comparing with their peers in the same grade. Questionnaire 3 asked them to select their present behavioral frequency as compared with their own past learning experience in secondary schools. In questionnaire 4, subjects were told to check off the relevant frequency of a behavior by comparing its frequency of occurrence with that of other language skills. Results showed that out of the 20 items used, 13 were significantly different among the four questionnaires. Methodological implications for questionnaire research are discussed, and suggestions for future research are proposed. (Contains 25 references.) (Author/NAV) |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |