A Stochastic Method for Balancing Item Exposure Rates in Computerized Classification Tests

Autor/inn/en	Huebner, Alan; Li, Zhushan
Titel	A Stochastic Method for Balancing Item Exposure Rates in Computerized Classification Tests
Quelle	In: Applied Psychological Measurement, 36 (2012) 3, S.181-188 (8 Seiten) PDF als Volltext Verfügbarkeit
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0146-6216
DOI	10.1177/0146621612439932
Schlagwörter	Computer Assisted Testing; Classification; Statistical Analysis; Test Items; Accuracy + Suchen Sie Ihr Suchwort? Classification system; Klassifikation; Klassifikationssystem; Statistische Analyse; Test content; Testaufgabe
Abstract	Computerized classification tests (CCTs) classify examinees into categories such as pass/fail, master/nonmaster, and so on. This article proposes the use of stochastic methods from sequential analysis to address item overexposure, a practical concern in operational CCTs. Item overexposure is traditionally dealt with in CCTs by the Sympson-Hetter (SH) method, but this method is unable to restrict the exposure of the most informative items to the desired level. The authors' new method of stochastic item exposure balance (SIEB) works in conjunction with the SH method and is shown to greatly reduce the number of overexposed items in a pool and improve overall exposure balance while maintaining classification accuracy comparable with using the SH method alone. The method is demonstrated using a simulation study. (Contains 3 tables.) (As Provided).
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Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2017/4/10