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Autor/inn/en | Ebesutani, Chad; Okamura, Kelsie; Higa-McMillan, Charmaine; Chorpita, Bruce F. |
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Titel | A Psychometric Analysis of the Positive and Negative Affect Schedule for Children-Parent Version in a School Sample |
Quelle | In: Psychological Assessment, 23 (2011) 2, S.406-416 (11 Seiten)
PDF als Volltext |
Sprache | englisch |
Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
ISSN | 1040-3590 |
DOI | 10.1037/a0022057 |
Schlagwörter | Measures (Individuals); Children; Adolescents; Parents; Factor Analysis; Validity; Reliability; Depression (Psychology); Anxiety; Hawaii |
Abstract | The current study was the 1st to examine the psychometric properties of the Positive and Negative Affect Schedule for Children-Parent Version (PANAS-C-P) using a large school-based sample of children and adolescents ages 8 to 18 (N = 606). Confirmatory factor analysis supported a 2-factor (correlated) model of positive affect (PA) and negative affect (NA). The PANAS-C-P scale scores also demonstrated acceptable internal consistency and convergent and divergent validity. The PANAS-C-P PA and NA scale scores also related to measures of anxiety and depression in a manner consistent with the tripartite model. Scale means and standard deviations were reported by grade and sex to provide normative data for the PANAS-C-P scales. Results from the present study provide initial support for the PANAS-C-P as a parent-reported perspective of youth PA and NA among school-based youths. (Contains 4 tables and 4 footnotes.) (As Provided). |
Anmerkungen | American Psychological Association. Journals Department, 750 First Street NE, Washington, DC 20002-4242. Tel: 800-374-2721; Tel: 202-336-5510; Fax: 202-336-5502; e-mail: order@apa.org; Web site: http://www.apa.org/publications |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
Update | 2017/4/10 |