Learning about Modes in Atomic Force Microscopy by Means of Hands-On Activities Based on a Simple Apparatus

Autor/inn/en	Phuapaiboon, Unchada; Panijpan, Bhinyo; Osotchan, Tanakorn
Titel	Learning about Modes in Atomic Force Microscopy by Means of Hands-On Activities Based on a Simple Apparatus
Quelle	In: Physics Education, 44 (2009) 3, S.306-309 (4 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0031-9120
DOI	10.1088/0031-9120/44/3/012
Schlagwörter	Nuclear Physics; Science Instruction; Hands on Science; Science Activities; Laboratory Equipment; Scientific Concepts; Science Experiments + Suchen Sie Ihr Suchwort? Atomphysik; Kernphysik; Teaching of science; Science education; Natural sciences Lessons; Naturwissenschaftlicher Unterricht; Laborausstattung
Abstract	This study was conducted to examine the results of using a low-cost hands-on setup in combination with accompanying activities to promote understanding of the contact mode of atomic force microscopy (AFM). This contact mode setup enabled learners to study how AFM works by hand scanning using probing cantilevers with different characteristics on two types of artificial surface. They also learnt how to select the various probing cantilevers on the basis of their understanding of the advantages and disadvantages of using them. (Contains 1 table and 2 figures.) (As Provided).
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Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2017/4/10