Simulated Tests of Differential Item Functioning Using SIBTEST with and without Impact

Autor/inn/en	Klockars, Alan J.; Lee, Yoonsun
Titel	Simulated Tests of Differential Item Functioning Using SIBTEST with and without Impact
Quelle	In: Journal of Educational Measurement, 45 (2008) 3, S.271-285 (15 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0022-0655
DOI	10.1111/j.1745-3984.2008.00064.x
Schlagwörter	Test Bias; Test Length; Reference Groups; Probability; Monte Carlo Methods; Sample Size; Test Items + Suchen Sie Ihr Suchwort? Testkritik; Reference group; Bezugsgruppe; Wahrscheinlichkeitsrechnung; Wahrscheinlichkeitstheorie; Monte-Carlo-Methode; Test content; Testaufgabe
Abstract	Monte Carlo simulations with 20,000 replications are reported to estimate the probability of rejecting the null hypothesis regarding DIF using SIBTEST when there is DIF present and/or when impact is present due to differences on the primary dimension to be measured. Sample sizes are varied from 250 to 2000 and test lengths from 10 to 40 items. Results generally support previous findings for Type I error rates and power. Impact is inversely related to test length. The combination of DIF and impact, with the focal group having lower ability on both the primary and secondary dimensions, results in impact partially masking DIF so that items biased toward the reference group are less likely to be detected. (As Provided).
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Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2017/4/10