Literaturnachweis - Detailanzeige
Autor/inn/en | Albanese, Mark A.; Forsyth, Robert A. |
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Titel | The One-, Two- and Modified Two-Parameter Latent Trait Models: An Empirical Study of Relative Fit. |
Quelle | In: Educational and Psychological Measurement, 44 (1984) 2, S.229-46Infoseite zur Zeitschrift |
Sprache | englisch |
Dokumenttyp | gedruckt; Zeitschriftenaufsatz |
Schlagwörter | Achievement Tests; Comparative Analysis; Goodness of Fit; Item Analysis; Latent Trait Theory; Mathematical Models; Secondary Education; Standardized Tests; Test Items; Iowa Tests of Educational Development |
Abstract | The purpose of this study was to compare the relative robustness of the one-, two-, and modified two-parameter latent trait logistic models for the Iowa Tests of Educational Development. Results suggest that the modified two-parameter model may provide the best representation of the data. (Author/BW) |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |