Literaturnachweis - Detailanzeige
| Autor/inn/en | Babik, Dmytro; Stevens, Scott P.; Waters, Andrew; Tinapple, David |
|---|---|
| Titel | The Effects of Dispersion and Reciprocity on Assessment Fidelity in Peer-Review Systems: A Simulation Study |
| Quelle | In: IEEE Transactions on Learning Technologies, 13 (2020) 3, S.580-592 (13 Seiten)Infoseite zur Zeitschrift
PDF als Volltext |
| Zusatzinformation | ORCID (Babik, Dmytro) ORCID (Stevens, Scott P.) ORCID (Tinapple, David) |
| Sprache | englisch |
| Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
| ISSN | 1939-1382 |
| DOI | 10.1109/TLT.2020.2971495 |
| Schlagwörter | Peer Evaluation; Fidelity; Networks; Evaluation Methods; Rating Scales; Monte Carlo Methods |
| Abstract | Over the last 20 years, online peer review and assessment have become widely used and well-researched practices in education. Their use increased, especially with the proliferation of nonconventional large-scale and online modes of teaching and learning, such as Massive Open Online Courses (MOOCs). A well-designed peer-review system is expected to produce valid and reliable assessments of the artifacts created by participants. These systems notably vary in designs, particularly in the structure of the peer-review networks, i.e., how participants are linked to each other as creators and reviewers. To date, little research has been done on how different network structures impact a system's ability to accurately assess the quality of the evaluated artifacts. We begin to address this gap, using a simulation approach to demonstrate that two network characteristics--dispersion and reciprocity--may indeed affect assessment fidelity in peer-review systems in conjunction with other design choices, such as evaluation scale and aggregation method. We also outline directions for further investigations of peer-review systems design. (As Provided). |
| Anmerkungen | Institute of Electrical and Electronics Engineers, Inc. 445 Hoes Lane, Piscataway, NJ 08854. Tel: 732-981-0060; Web site: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4620076 |
| Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
| Update | 2024/1/01 |
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