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Autor/inn/en | Engstrom, Tyler A.; Johnson, Matthew M.; Eklund, Peter C.; Russin, Timothy J. |
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Titel | A Computer-Controlled Classroom Model of an Atomic Force Microscope |
Quelle | In: Physics Teacher, 53 (2015) 9, S.536-538 (3 Seiten)Infoseite zur Zeitschrift
PDF als Volltext |
Sprache | englisch |
Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
ISSN | 0031-921X |
DOI | 10.1119/1.4935764 |
Schlagwörter | Nuclear Physics; Laboratory Equipment; Molecular Structure; Computer Simulation; Scientific Concepts; Science Instruction; Topography |
Abstract | The concept of "seeing by feeling" as a way to circumvent limitations on sight is universal on the macroscopic scale--reading Braille, feeling one's way around a dark room, etc. The development of the atomic force microscope (AFM) in 1986 extended this concept to imaging in the nanoscale. While there are classroom demonstrations that use a tactile probe to map the topography or some other property of a sample, the rastering of the probe over the sample is manually controlled, which is both tedious and potentially inaccurate. Other groups have used simulation or tele-operation of an AFM probe. In this paper we describe a teaching AFM with complete computer control to map out topographic and magnetic properties of a "crystal" consisting of twodimensional arrays of spherical marble "atoms." Our AFM is well suited for lessons on the "Big Ideas of Nanoscale" such as tools and instrumentation, as well as a pre-teaching activity for groups with remote access AFM or mobile AFM. The principle of operation of our classroom AFM is the same as that of a real AFM, excepting the nature of the force between sample and probe. (As Provided). |
Anmerkungen | American Association of Physics Teachers. One Physics Ellipse, College Park, MD 20740. Tel: 301-209-3300; Fax: 301-209-0845; e-mail: pubs@aapt.org; Web site: http://scitation.aip.org/tpt |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
Update | 2020/1/01 |