Using Testlet Response Theory to Examine Local Dependence in C-Tests

Autor/inn/en	Eckes, Thomas; Baghaei, Purya
Titel	Using Testlet Response Theory to Examine Local Dependence in C-Tests
Quelle	In: Applied Measurement in Education, 28 (2015) 2, S.85-98 (14 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0895-7347
DOI	10.1080/08957347.2014.1002919
Schlagwörter	Language Proficiency; Language Tests; Item Response Theory; Test Reliability; Evaluation Methods; Responses; Second Language Learning; German; Foreign Students; College Students; Bayesian Statistics + Suchen Sie Ihr Suchwort? Language skill; Language skills; Sprachkompetenz; Language test; Sprachtest; Item-Response-Theorie; Testreliabilität; Zweitsprachenerwerb; Deutscher; Collegestudent
Abstract	C-tests are gap-filling tests widely used to assess general language proficiency for purposes of placement, screening, or provision of feedback to language learners. C-tests consist of several short texts in which parts of words are missing. We addressed the issue of local dependence in C-tests using an explicit modeling approach based on testlet response theory. Data were provided by a total sample of 4,708 participants working on eight C-test texts with 20 gaps each. The resulting parameter estimates were compared to those obtained from (a) a polytomous item response theory (IRT) model and (b) a standard IRT model that ignored the dependence structure. Testlet effects proved to be very small and correspondence between parameters obtained from the different modeling approaches was high. When local dependence was ignored reliability of the C-test was slightly overestimated. Implications for the analysis of testlets in general, and C-tests in particular are discussed. (As Provided).
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Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2020/1/01