Applying a Multiple Comparison Control to IRT Item-Fit Testing

Autor/inn/en	Sauder, Derek; DeMars, Christine
Titel	Applying a Multiple Comparison Control to IRT Item-Fit Testing
Quelle	In: Applied Measurement in Education, 33 (2020) 4, S.362-377 (16 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0895-7347
DOI	10.1080/08957347.2020.1789138
Schlagwörter	Item Response Theory; Test Items; Sample Size; Test Length; Goodness of Fit; Error Correction; Statistical Analysis + Suchen Sie Ihr Suchwort? Item-Response-Theorie; Test content; Testaufgabe; Korrektur; Statistische Analyse
Abstract	We used simulation techniques to assess the item-level and familywise Type I error control and power of an IRT item-fit statistic, the "S-X"[superscript 2]. Previous research indicated that the "S-X"[superscript 2] has good Type I error control and decent power, but no previous research examined familywise Type I error control. We varied percentage of misfitting items, sample size, and test length, and computed familywise Type I error with no correction, a Bonferroni correction, and a Benjamini-Hochberg correction. The "S-X"[superscript 2] controlled item-level and familywise Type I errors when corrections were applied to conditions with no misfitting items. In the presence of misfitting items, the "S-X"[superscript 2] exhibited inflated item-level and familywise false hit rates in many conditions, even with familywise Type I error corrections. Lastly, power was low and negatively impacted when either of the familywise Type I error corrections was applied. We suggest using the "S-X"[superscript 2] with no familywise Type I error control in conjunction with other methods of assessing item fit (e.g., visual analysis). (As Provided).
Anmerkungen	Routledge. Available from: Taylor & Francis, Ltd. 530 Walnut Street Suite 850, Philadelphia, PA 19106. Tel: 800-354-1420; Tel: 215-625-8900; Fax: 215-207-0050; Web site: http://www.tandf.co.uk/journals
Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2024/1/01