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Autor/inn/en | Putwain, David W.; Symes, Wendy; Coxon, Elaine; Gallard, Diahann |
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Titel | Attention Bias in Test Anxiety: The Impact of a Test-Threat Congruent Situation, Presentation Time, and Approach-Avoidance Temperament |
Quelle | In: Educational Psychology, 40 (2020) 6, S.713-734 (22 Seiten)Infoseite zur Zeitschrift
PDF als Volltext |
Zusatzinformation | ORCID (Putwain, David W.) ORCID (Gallard, Diahann) |
Sprache | englisch |
Dokumenttyp | gedruckt; online; Zeitschriftenaufsatz |
ISSN | 0144-3410 |
DOI | 10.1080/01443410.2020.1740653 |
Schlagwörter | Test Anxiety; Bias; Personality Traits; Psychological Patterns; Foreign Countries; Cognitive Processes; Stimuli; Secondary School Students; Late Adolescents; High Stakes Tests; Likert Scales; Attention Control; Cognitive Tests; United Kingdom (England); State Trait Anxiety Inventory |
Abstract | Previous studies have shown that test anxiety is related to attention bias. It is not clear, however, whether a congruent test-threat manipulation is required to elicit this bias or whether the bias is a result of automatic or conscious processes. In the present study we used a mood induction procedure to examine attention bias in test anxious persons using a dot-probe task and incorporated approach-avoidance temperament as a possible moderator. Results showed that the mood induction procedure was not effective in manipulating state anxiety. In the absence of an effective test-threat manipulation, high test anxious persons showed attention bias towards supraliminal threat stimuli. Attention bias was only shown to subliminal threat stimuli in high test anxious persons with a strong approach temperament. This suggests that the mechanism for attention bias to threat stimuli in high test anxious persons is a result of both automatic and conscious processes. (As Provided). |
Anmerkungen | Routledge. Available from: Taylor & Francis, Ltd. 530 Walnut Street Suite 850, Philadelphia, PA 19106. Tel: 800-354-1420; Tel: 215-625-8900; Fax: 215-207-0050; Web site: http://www.tandf.co.uk/journals |
Erfasst von | ERIC (Education Resources Information Center), Washington, DC |
Update | 2024/1/01 |