A Method for Detecting Regression of Hard and Easy Item Angoff Ratings

Autor/inn/en	Wyse, Adam E.; Babcock, Ben
Titel	A Method for Detecting Regression of Hard and Easy Item Angoff Ratings
Quelle	In: Journal of Educational Measurement, 56 (2019) 1, S.28-50 (23 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	0022-0655
DOI	10.1111/jedm.12199
Schlagwörter	Item Analysis; Standard Setting; Probability; Feedback (Response); Simulation; Test Items + Suchen Sie Ihr Suchwort? Itemanalyse; Standardisierung; Wahrscheinlichkeitsrechnung; Wahrscheinlichkeitstheorie; Simulation program; Simulationsprogramm; Test content; Testaufgabe
Abstract	One common phenomenon in Angoff standard setting is that panelists regress their ratings in toward the middle of the probability scale. This study describes two indices based on taking ratios of standard deviations that can be utilized with a scatterplot of item ratings versus expected probabilities of success to identify whether ratings are regressed in toward the middle of the probability scale. Results from a simulation study show that the standard deviation ratio indices can successfully detect ratings for hard and easy items that are regressed in toward the middle of the probability scale in Angoff standard-setting data, where previously proposed indices often do not work as well to detect these effects. Results from a real data set show that, while virtually all raters improve from Round 1 to Round 2 as measured by previously developed indices, the standard deviation ratios in conjunction with a scatterplot of item ratings versus expected probabilities of success can identify individuals who may still be regressing their ratings in toward the middle of the probability scale even after receiving feedback. The authors suggest using the scatterplot along with the standard deviation ratio indices and other statistics for measuring the quality of Angoff standard-setting data. (As Provided).
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Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2020/1/01