A Comparative Investigation on the Learning Efficacy of Mechatronic Technology between Academic and Vocational High School Students

Autor/inn/en	Jou, Min; Hung, Chen-Kang; Lai, Shih-Hung
Titel	A Comparative Investigation on the Learning Efficacy of Mechatronic Technology between Academic and Vocational High School Students
Quelle	In: Journal of Science Education and Technology, 23 (2014) 6, S.777-783 (7 Seiten)Infoseite zur Zeitschrift PDF als Volltext Verfügbarkeit
Sprache	englisch
Dokumenttyp	gedruckt; online; Zeitschriftenaufsatz
ISSN	1059-0145
DOI	10.1007/s10956-014-9511-y
Schlagwörter	Foreign Countries; Comparative Analysis; High School Students; Vocational Education; Academic Education; College Students; Engineering Education; Differences; Cognitive Processes; Comprehension; Path Analysis; Statistical Analysis; Learning; Taiwan + Suchen Sie Ihr Suchwort? Ausland; High school; High schools; Student; Students; Oberschule; Schüler; Schülerin; Studentin; Ausbildung; Berufsbildung; Akademische Bildung; Collegestudent; Ingenieurausbildung; Unterscheiden; Cognitive process; Kognitiver Prozess; Verstehen; Verständnis; Pfadanalyse; Statistische Analyse; Lernen
Abstract	Universities in Taiwan can be divided into two major categories of comprehensive universities and technological universities. Students studying engineering majors in comprehensive universities are often recruited from academic high schools while those in technological universities tend to be recruited from vocational high schools. The purpose of this research was to investigate differences in learning efficacy between college students with academic backgrounds and those with vocational backgrounds. Results indicated no significant differences in cognition between the two groups of students. Additionally, students with vocational school backgrounds performed better in comprehension skills compared with those with academic backgrounds and were more able to apply acquired knowledge to practical tasks according to path analysis studies and the Mann-Whitney "U" test. (As Provided).
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Erfasst von	ERIC (Education Resources Information Center), Washington, DC
Update	2017/4/10